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31.080.01 Semiconductor devices in general
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BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Released: 2017-11-28
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BS EN 60749-1:2003
Semiconductor devices. Mechanical and climatic test methods General
Semiconductor devices. Mechanical and climatic test methods General
Released: 2003-07-07
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PD IEC/TR 63133:2017
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Released: 2018-01-29
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PD ES 59008-5-1:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Released: 2001-07-15
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BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Released: 2008-10-31
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255.20 EUR
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BS EN IEC 60191-1:2018
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Released: 2018-04-30
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BS EN 60749-11:2002
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Released: 2003-10-24
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PD IEC TR 63378-1:2021
Thermal standardization on semiconductor packages Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
Thermal standardization on semiconductor packages Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
Released: 2022-01-11
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BS EN IEC 60749-28:2022
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level
Released: 2022-09-06
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BS EN IEC 60749-10:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Released: 2022-09-15
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257.52 EUR
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