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31.080.01 Semiconductor devices in general
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BS IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Released: 2023-08-31
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BS EN IEC 62007-2:2025
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Released: 2025-09-23
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BS EN IEC 63378-3:2025
Thermal standardization on semiconductor packages Thermal circuit simulation models of discrete semiconductor packages for transient analysis
Thermal standardization on semiconductor packages Thermal circuit simulation models of discrete semiconductor packages for transient analysis
Released: 2025-06-24
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BS EN 60191-3:2000
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Released: 2000-06-15
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354.96 EUR
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155.44 EUR
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BS EN 60749-22:2003
Semiconductor devices. Mechanical and climatic test methods Bond strength
Semiconductor devices. Mechanical and climatic test methods Bond strength
Released: 2003-07-04
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BS EN 60068-2-77:1999
Environmental testing. Test methods Body strength and impact shock
Environmental testing. Test methods Body strength and impact shock
Released: 1999-09-15
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BS EN 60749-42:2014
Semiconductor devices. Mechanical and climatic test methods Temperature and humidity storage
Semiconductor devices. Mechanical and climatic test methods Temperature and humidity storage
Released: 2014-10-31
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