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31.080.01 Semiconductor devices in general
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BS EN IEC 60749-28:2022
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level
Released: 2022-09-06
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342.72 EUR
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22.40 EUR
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BS EN IEC 63378-3:2025
Thermal standardization on semiconductor packages Thermal circuit simulation models of discrete semiconductor packages for transient analysis
Thermal standardization on semiconductor packages Thermal circuit simulation models of discrete semiconductor packages for transient analysis
Released: 2025-06-24
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BS EN IEC 62007-2:2025
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Released: 2025-09-23
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324.80 EUR
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324.80 EUR
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BS EN 60068-2-77:1999
Environmental testing. Test methods Body strength and impact shock
Environmental testing. Test methods Body strength and impact shock
Released: 1999-09-15
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BS EN 60749-19:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Released: 2010-10-31
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BS EN 60191-3:2000
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Released: 2000-06-15
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18/30383935 DC
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2018-12-04
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