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31.080.01 Semiconductor devices in general
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BS EN 60191-3:2000
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Released: 2000-06-15
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342.72 EUR
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342.72 EUR
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150.08 EUR
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BS IEC 60747-16-2:2001
Semiconductor devices Microwave integrated circuits. Frequency prescalers
Semiconductor devices Microwave integrated circuits. Frequency prescalers
Released: 2008-01-31
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288.96 EUR
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BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods External visual examination
Semiconductor devices. Mechanical and climatic test methods External visual examination
Released: 2017-11-24
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176.96 EUR
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246.40 EUR
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BS EN 60749-19:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Released: 2010-10-31
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BS EN 60749-42:2014
Semiconductor devices. Mechanical and climatic test methods Temperature and humidity storage
Semiconductor devices. Mechanical and climatic test methods Temperature and humidity storage
Released: 2014-10-31
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BS IEC 796-1:1990
Microprocessor system bus. 8-bit and 16-bit data MULTIBUS I Functional description with electrical and timing specifications
Microprocessor system bus. 8-bit and 16-bit data MULTIBUS I Functional description with electrical and timing specifications
Released: 1991-02-28
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324.80 EUR
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BS EN 60749-33:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Released: 2004-06-22
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BS IEC 62047-29:2017
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Released: 2018-03-15
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BS EN 60749-36:2003
Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
Released: 2003-06-19
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150.08 EUR
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288.96 EUR
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