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31.080.01 Semiconductor devices in general
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BS EN 60749-32:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)
Released: 2011-03-31
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155.44 EUR
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155.44 EUR
BS EN 60749-36:2003
Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
Released: 2003-06-19
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155.44 EUR
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155.44 EUR
BS EN 62779-2:2016
Semiconductor devices. Semiconductor interface for human body communication Characterization of interfacing performances
Semiconductor devices. Semiconductor interface for human body communication Characterization of interfacing performances
Released: 2016-06-30
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183.28 EUR
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183.28 EUR
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299.28 EUR
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299.28 EUR
BS IEC 796-1:1990
Microprocessor system bus. 8-bit and 16-bit data MULTIBUS I Functional description with electrical and timing specifications
Microprocessor system bus. 8-bit and 16-bit data MULTIBUS I Functional description with electrical and timing specifications
Released: 1991-02-28
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336.40 EUR
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336.40 EUR
BS EN 60749-33:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Released: 2004-06-22
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155.44 EUR
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BS IEC 62483:2013
Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices
Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices
Released: 2013-10-31
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354.96 EUR
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354.96 EUR
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255.20 EUR
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255.20 EUR
BS IEC 62047-29:2017
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Released: 2018-03-15
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183.28 EUR
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183.28 EUR
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255.20 EUR
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255.20 EUR
BS EN 60068-2-77:1999
Environmental testing. Test methods Body strength and impact shock
Environmental testing. Test methods Body strength and impact shock
Released: 1999-09-15
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183.28 EUR
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183.28 EUR
BS EN 60191-3:2000
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Released: 2000-06-15
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354.96 EUR
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354.96 EUR