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31.080.01 Semiconductor devices in general
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BS IEC 60747-18-4:2023
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Released: 2023-03-27
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176.96 EUR
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176.96 EUR
BS IEC 62880-1:2017
Semiconductor devices. Stress migration test standard Copper stress migration test standard
Semiconductor devices. Stress migration test standard Copper stress migration test standard
Released: 2020-07-21
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246.40 EUR
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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BS EN IEC 60749-26:2018 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Released: 2020-02-27
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481.60 EUR
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BS IEC 60747-18-2:2020
Semiconductor devices Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
Semiconductor devices Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
Released: 2020-02-21
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176.96 EUR
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22.40 EUR
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24/30491834 DC
Draft BS EN 60747-14-12 ED1 Semiconductor devices Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
Draft BS EN 60747-14-12 ED1 Semiconductor devices Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
Released: 2024-04-23
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22.40 EUR
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22.40 EUR
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BS EN IEC 60749-34-1:2025
Semiconductor devices. Mechanical and climatic test methods Power cycling test for power semiconductor module
Semiconductor devices. Mechanical and climatic test methods Power cycling test for power semiconductor module
Released: 2025-08-18
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288.96 EUR
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25/30511332 DC
Draft BS EN 60747-17 Ed.2.0 Semiconductor devices Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Draft BS EN 60747-17 Ed.2.0 Semiconductor devices Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Released: 2025-08-26
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22.40 EUR
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