PRICES include / exclude VAT
31.080.99 Other semiconductor devices
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
BS IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Released: 2023-08-31
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
259.84 EUR
English Hardcopy
In stock
259.84 EUR
BS EN IEC 63287-2:2023
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
Released: 2023-05-23
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
185.92 EUR
English Hardcopy
In stock
185.92 EUR
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
22.40 EUR
English Hardcopy
In stock
22.40 EUR
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
185.92 EUR
English Hardcopy
In stock
185.92 EUR
BS EN IEC 63244-1:2021
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Released: 2021-11-05
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
304.64 EUR
English Hardcopy
In stock
304.64 EUR
BS EN IEC 62031:2020+A11:2021
LED modules for general lighting. Safety specifications
LED modules for general lighting. Safety specifications
Released: 2022-03-31
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
259.84 EUR
English Hardcopy
In stock
259.84 EUR
BS IEC 63150-3:2025
Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Human foot impact motion
Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Human foot impact motion
Released: 2025-11-04
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
259.84 EUR
English Hardcopy
In stock
259.84 EUR
BS IEC 62047-53:2025
Semiconductor devices. Micro-electromechanical devices MEMS electrothermal transfer device
Semiconductor devices. Micro-electromechanical devices MEMS electrothermal transfer device
Released: 2025-10-08
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
185.92 EUR
English Hardcopy
In stock
185.92 EUR
BS EN 62047-5:2011
Semiconductor devices. Micro-electromechanical devices RF MEMS switches
Semiconductor devices. Micro-electromechanical devices RF MEMS switches
Released: 2013-04-30
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
304.64 EUR
English Hardcopy
In stock
304.64 EUR
18/30383935 DC
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2018-12-04
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
22.40 EUR
English Hardcopy
In stock
22.40 EUR
BS EN 62047-14:2012
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Released: 2012-05-31
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
185.92 EUR
English Hardcopy
In stock
185.92 EUR
BS EN 62047-21:2014
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials
Released: 2014-10-31
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
185.92 EUR
English Hardcopy
In stock
185.92 EUR