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BS IEC 60747-5-13:2021
Semiconductor devices Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
Semiconductor devices Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
Released: 2021-06-28
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BS IEC 62047-53:2025
Semiconductor devices. Micro-electromechanical devices MEMS electrothermal transfer device
Semiconductor devices. Micro-electromechanical devices MEMS electrothermal transfer device
Released: 2025-10-08
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BS IEC 63150-3:2025
Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Human foot impact motion
Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Human foot impact motion
Released: 2025-11-04
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BS IEC 62047-47:2024
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of bending strength of microstructures
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of bending strength of microstructures
Released: 2024-08-28
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24/30499009 DC
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
Released: 2024-08-16
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BS EN 62047-14:2012
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Released: 2012-05-31
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BS EN 62047-21:2014
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials
Released: 2014-10-31
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BS EN 61223-3-1:1999
Evaluation and routine testing in medical imaging departments Acceptance tests
Evaluation and routine testing in medical imaging departments Acceptance tests
Released: 1999-08-15
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BS EN 62047-5:2011
Semiconductor devices. Micro-electromechanical devices RF MEMS switches
Semiconductor devices. Micro-electromechanical devices RF MEMS switches
Released: 2013-04-30
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18/30383935 DC
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2018-12-04
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