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BS EN IEC 63550-4 Semiconductor devices. Neuromorphic devices Evaluation method of asymmetry in neuromorphic memristor devices
BS EN IEC 63550-4 Semiconductor devices. Neuromorphic devices Evaluation method of asymmetry in neuromorphic memristor devices
Released: 2024-09-06
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24.00 EUR
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24.00 EUR
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BS IEC 62047-44:2024
Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
Released: 2024-02-29
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189.60 EUR
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189.60 EUR
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BS IEC 62047-45:2025
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of impact resistance of nanostructures
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of impact resistance of nanostructures
Released: 2025-04-01
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BS EN 62258-5:2006
Semiconductor die products Requirements for information concerning electrical simulation
Semiconductor die products Requirements for information concerning electrical simulation
Released: 2006-11-30
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BS EN 62047-12:2011
Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Released: 2011-11-30
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BS EN 62258-2:2011
Semiconductor die products Exchange data formats
Semiconductor die products Exchange data formats
Released: 2011-07-31
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396.00 EUR
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396.00 EUR
PD CLC/TR 62258-4:2013
Semiconductor die products Questionnaire for die users and suppliers
Semiconductor die products Questionnaire for die users and suppliers
Released: 2014-11-30
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BS EN 62047-8:2011
Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films
Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films
Released: 2011-06-30
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PD IEC/TR 62258-8:2008
Semiconductor die products EXPRESS model schema for data exchange
Semiconductor die products EXPRESS model schema for data exchange
Released: 2008-09-30
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264.00 EUR
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264.00 EUR
BS IEC 62047-31:2019
Semiconductor devices. Micro-electromechanical devices Four-point bending test method for interfacial adhesion energy of layered MEMS materials
Semiconductor devices. Micro-electromechanical devices Four-point bending test method for interfacial adhesion energy of layered MEMS materials
Released: 2019-04-17
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