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23/30476409 DC
BS IEC 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
BS IEC 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
Released: 2023-07-05
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41.76 EUR
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41.76 EUR
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255.20 EUR
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255.20 EUR
BS IEC 60747-5-15:2022
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
Released: 2022-07-19
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183.28 EUR
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24/30499668 DC
BS EN IEC 63550-1 Semiconductor devices - Neuromorphic devices Part 1: Evaluation method of basic characteristics in memristor devices
BS EN IEC 63550-1 Semiconductor devices - Neuromorphic devices Part 1: Evaluation method of basic characteristics in memristor devices
Released: 2024-08-30
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23.20 EUR
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23.20 EUR
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24/30500235 DC
BS EN IEC 62047-53 Semiconductor devices. Micro-electromechanical devices Part 53. MEMS electrothermal transfer device
BS EN IEC 62047-53 Semiconductor devices. Micro-electromechanical devices Part 53. MEMS electrothermal transfer device
Released: 2024-09-13
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23.20 EUR
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BS EN IEC 60747-15:2024 - TC
Tracked Changes. Semiconductor devices Discrete devices. Isolated power semiconductor devices
Tracked Changes. Semiconductor devices Discrete devices. Isolated power semiconductor devices
Released: 2024-12-20
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498.80 EUR
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498.80 EUR
BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Released: 1987-10-30
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382.80 EUR
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382.80 EUR
BS EN 62047-6:2010
Semiconductor devices. Micro-electromechanical devices Axial fatigue testing methods of thin film materials
Semiconductor devices. Micro-electromechanical devices Axial fatigue testing methods of thin film materials
Released: 2010-04-30
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183.28 EUR
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183.28 EUR
BS EN 62047-10:2011
Semiconductor devices. Micro-electromechanical devices Micro-pillar compression test for MEMS materials
Semiconductor devices. Micro-electromechanical devices Micro-pillar compression test for MEMS materials
Released: 2011-09-30
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183.28 EUR
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183.28 EUR
BS IEC 62830-2:2017
Semiconductor devices. Semiconductor devices for energy harvesting and generation Thermo power based thermoelectric energy harvesting
Semiconductor devices. Semiconductor devices for energy harvesting and generation Thermo power based thermoelectric energy harvesting
Released: 2017-08-10
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183.28 EUR
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183.28 EUR
BS EN 62047-3:2006
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
Released: 2006-11-30
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155.44 EUR
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155.44 EUR