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BS IEC 62951-8:2023
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Released: 2023-01-24
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189.60 EUR
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189.60 EUR
BS EN IEC 63364-1:2022
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Released: 2023-02-02
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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2023-04-05
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24/30488096 DC
BS EN IEC 62031 LED modules. Safety requirements
BS EN IEC 62031 LED modules. Safety requirements
Released: 2024-04-12
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24.00 EUR
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24.00 EUR
24/30488515 DC
BS EN IEC 62047-50. Semiconductor devices. Micro-electromechanical devices Part 50. MEMS capacitive microphone
BS EN IEC 62047-50. Semiconductor devices. Micro-electromechanical devices Part 50. MEMS capacitive microphone
Released: 2024-03-05
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24/30497861 DC
BS EN IEC 63551-1. Semiconductor devices. Detection modules of autonomous land vehicle Part 1. Testing methods of detection performance for LiDAR
BS EN IEC 63551-1. Semiconductor devices. Detection modules of autonomous land vehicle Part 1. Testing methods of detection performance for LiDAR
Released: 2024-08-01
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BS EN IEC 60747-15:2024 - TC
Tracked Changes. Semiconductor devices Discrete devices. Isolated power semiconductor devices
Tracked Changes. Semiconductor devices Discrete devices. Isolated power semiconductor devices
Released: 2024-12-20
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516.00 EUR
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516.00 EUR
BS EN 61967-2:2005
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method
Released: 2006-01-23
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264.00 EUR
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264.00 EUR
BS EN 60747-5-2:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
Released: 2003-01-17
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309.60 EUR
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309.60 EUR
BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Released: 1987-10-30
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396.00 EUR
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396.00 EUR
BS EN 62047-22:2014
Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates
Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates
Released: 2014-10-31
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160.80 EUR
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160.80 EUR
BS IEC 60747-14-2:2000
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors Hall elements
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors Hall elements
Released: 2001-05-15
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189.60 EUR
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189.60 EUR