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BS EN 62047-4:2010
Semiconductor devices. Micro-electromechanical devices Generic specification for MEMS
Semiconductor devices. Micro-electromechanical devices Generic specification for MEMS
Released: 2010-11-30
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264.00 EUR
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264.00 EUR
BS EN 62047-20:2014
Semiconductor devices. Micro-electromechanical devices Gyroscopes
Semiconductor devices. Micro-electromechanical devices Gyroscopes
Released: 2014-10-31
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367.20 EUR
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367.20 EUR
BS EN 62258-6:2006
Semiconductor die products Requirements for information concerning thermal simulation
Semiconductor die products Requirements for information concerning thermal simulation
Released: 2006-11-30
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160.80 EUR
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160.80 EUR
BS EN 62258-1:2010
Semiconductor die products Procurement and use
Semiconductor die products Procurement and use
Released: 2010-11-30
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348.00 EUR
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348.00 EUR
BS EN IEC 62969-3:2018
Semiconductor devices. Semiconductor interface for automotive vehicles Shock driven piezoelectric energy harvesting for automotive vehicle sensors
Semiconductor devices. Semiconductor interface for automotive vehicles Shock driven piezoelectric energy harvesting for automotive vehicle sensors
Released: 2018-06-28
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BS EN 62047-2:2006
Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials
Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials
Released: 2006-11-30
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189.60 EUR
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189.60 EUR
BS EN 60747-16-1:2002+A2:2017
Semiconductor devices Microwave integrated circuits. Amplifiers
Semiconductor devices Microwave integrated circuits. Amplifiers
Released: 2018-04-10
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396.00 EUR
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396.00 EUR
BS EN 60747-5-3:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Measuring methods
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Measuring methods
Released: 2003-01-20
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348.00 EUR
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348.00 EUR
BS EN 60512-2-6:2002
Connectors for electronic equipment. Tests and measurements. Electrical continuity and contact resistance tests Test 2f. Housing (shell) electrical continuity
Connectors for electronic equipment. Tests and measurements. Electrical continuity and contact resistance tests Test 2f. Housing (shell) electrical continuity
Released: 2002-05-24
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160.80 EUR
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160.80 EUR
BS EN 62830-3:2017
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based electromagnetic energy harvesting
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based electromagnetic energy harvesting
Released: 2017-04-30
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264.00 EUR
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264.00 EUR
BS EN 62047-17:2015
Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films
Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films
Released: 2015-07-31
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309.60 EUR
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309.60 EUR
BS IEC 62047-28:2017
Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting devices
Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting devices
Released: 2020-07-22
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189.60 EUR
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189.60 EUR