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BS EN 62047-4:2010
Semiconductor devices. Micro-electromechanical devices Generic specification for MEMS
Semiconductor devices. Micro-electromechanical devices Generic specification for MEMS
Released: 2010-11-30
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264.00 EUR
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264.00 EUR
BS EN 62258-6:2006
Semiconductor die products Requirements for information concerning thermal simulation
Semiconductor die products Requirements for information concerning thermal simulation
Released: 2006-11-30
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160.80 EUR
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160.80 EUR
BS EN 62258-1:2010
Semiconductor die products Procurement and use
Semiconductor die products Procurement and use
Released: 2010-11-30
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348.00 EUR
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348.00 EUR
BS EN 62047-20:2014
Semiconductor devices. Micro-electromechanical devices Gyroscopes
Semiconductor devices. Micro-electromechanical devices Gyroscopes
Released: 2014-10-31
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367.20 EUR
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367.20 EUR
BS EN 60747-16-1:2002+A2:2017
Semiconductor devices Microwave integrated circuits. Amplifiers
Semiconductor devices Microwave integrated circuits. Amplifiers
Released: 2018-04-10
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396.00 EUR
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396.00 EUR
BS EN 60747-5-3:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Measuring methods
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Measuring methods
Released: 2003-01-20
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348.00 EUR
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348.00 EUR
BS EN 60512-2-6:2002
Connectors for electronic equipment. Tests and measurements. Electrical continuity and contact resistance tests Test 2f. Housing (shell) electrical continuity
Connectors for electronic equipment. Tests and measurements. Electrical continuity and contact resistance tests Test 2f. Housing (shell) electrical continuity
Released: 2002-05-24
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160.80 EUR
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160.80 EUR
BS IEC 62047-32:2019
Semiconductor devices. Micro-electromechanical devices Test method for the nonlinear vibration of MEMS resonators
Semiconductor devices. Micro-electromechanical devices Test method for the nonlinear vibration of MEMS resonators
Released: 2019-01-29
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189.60 EUR
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189.60 EUR
BS IEC 60747-14-3:2009
Semiconductor devices Semiconductor sensors. Pressure sensors
Semiconductor devices Semiconductor sensors. Pressure sensors
Released: 2009-07-31
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264.00 EUR
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264.00 EUR
BS IEC 63068-1:2019
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification of defects
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification of defects
Released: 2019-05-10
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264.00 EUR
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264.00 EUR
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189.60 EUR
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189.60 EUR
BS EN IEC 62969-3:2018
Semiconductor devices. Semiconductor interface for automotive vehicles Shock driven piezoelectric energy harvesting for automotive vehicle sensors
Semiconductor devices. Semiconductor interface for automotive vehicles Shock driven piezoelectric energy harvesting for automotive vehicle sensors
Released: 2018-06-28
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264.00 EUR
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264.00 EUR