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24/30500239 DC
BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
Released: 2024-09-13
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24/30499096 DC
BS EN IEC 63602 Guidelines for Representing Switching Losses of SIC MOSFETs in Datasheets (Fast track)
BS EN IEC 63602 Guidelines for Representing Switching Losses of SIC MOSFETs in Datasheets (Fast track)
Released: 2024-10-04
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24/30500231 DC
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
Released: 2024-09-13
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BS IEC 60747-18-4:2023
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Released: 2023-03-27
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BS EN IEC 60747-5-13/AMD1 Amendment 1 - Semiconductor devices Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
BS EN IEC 60747-5-13/AMD1 Amendment 1 - Semiconductor devices Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
Released: 2025-02-28
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