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31.080.01 Semiconductor devices in general
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BS EN IEC 63364-1:2022
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Released: 2023-02-02
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BS IEC 62951-8:2023
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Released: 2023-01-24
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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2023-04-05
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BS EN IEC 60749-5:2024
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Released: 2024-02-06
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BS EN IEC 62007-2:2025 - TC
Tracked Changes. Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Tracked Changes. Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Released: 2025-10-10
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25/30511310 DC
Draft BS EN 62047-56 Micro-electromechanical devices Part 56. Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor
Draft BS EN 62047-56 Micro-electromechanical devices Part 56. Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor
Released: 2025-07-21
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25/30461045 DC
Draft BS EN 63464-1 Medical electrical equipment Particular requirements for the basic safety and essential performance of neutron capture therapy equipment
Draft BS EN 63464-1 Medical electrical equipment Particular requirements for the basic safety and essential performance of neutron capture therapy equipment
Released: 2025-11-13
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25/30510415 DC
Draft BS EN 63551-5 Semiconductor devices - Detection modules of autonomous land vehicle Part 5: Testing methods of performance for ultrasonic modules
Draft BS EN 63551-5 Semiconductor devices - Detection modules of autonomous land vehicle Part 5: Testing methods of performance for ultrasonic modules
Released: 2025-11-13
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25/30510419 DC
Draft BS EN 63551-6 Semiconductor devices - Detection modules of autonomous land vehicle Part 6: Testing methods of performance for visual imaging modules
Draft BS EN 63551-6 Semiconductor devices - Detection modules of autonomous land vehicle Part 6: Testing methods of performance for visual imaging modules
Released: 2025-11-13
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BS EN 60749-23:2004+A1:2011
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Released: 2011-06-30
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159.04 EUR
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BS EN 60749-27:2006+A1:2012
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
Released: 2013-01-31
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