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31.080.01 Semiconductor devices in general
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BS EN IEC 60749-17:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2020-02-24
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224.00 EUR
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BS EN IEC 60749-5:2024
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Released: 2024-02-06
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185.92 EUR
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185.92 EUR
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22.40 EUR
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22.40 EUR
BS EN IEC 62007-2:2025 - TC
Tracked Changes. Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Tracked Changes. Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Released: 2025-10-10
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481.60 EUR
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25/30511310 DC
Draft BS EN 62047-56 Micro-electromechanical devices Part 56. Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor
Draft BS EN 62047-56 Micro-electromechanical devices Part 56. Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor
Released: 2025-07-21
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BS EN IEC 60749-22-2:2026
Semiconductor devices — Mechanical and climatic test methods Bond strength — Wire bond shear test methods
Semiconductor devices — Mechanical and climatic test methods Bond strength — Wire bond shear test methods
Released: 2026-01-21
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25/30461045 DC
Draft BS EN 63464-1 Medical electrical equipment Particular requirements for the basic safety and essential performance of neutron capture therapy equipment
Draft BS EN 63464-1 Medical electrical equipment Particular requirements for the basic safety and essential performance of neutron capture therapy equipment
Released: 2025-11-13
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40.32 EUR
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25/30510415 DC
Draft BS EN 63551-5 Semiconductor devices - Detection modules of autonomous land vehicle Part 5: Testing methods of performance for ultrasonic modules
Draft BS EN 63551-5 Semiconductor devices - Detection modules of autonomous land vehicle Part 5: Testing methods of performance for ultrasonic modules
Released: 2025-11-13
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25/30510419 DC
Draft BS EN 63551-6 Semiconductor devices - Detection modules of autonomous land vehicle Part 6: Testing methods of performance for visual imaging modules
Draft BS EN 63551-6 Semiconductor devices - Detection modules of autonomous land vehicle Part 6: Testing methods of performance for visual imaging modules
Released: 2025-11-13
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BS EN 60749-44:2016
Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Released: 2016-11-30
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259.84 EUR
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BS EN 60749-9:2017
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
Released: 2017-11-27
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159.04 EUR
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BS EN 60749-23:2004+A1:2011
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Released: 2011-06-30
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