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31.080.01 Semiconductor devices in general
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BS EN IEC 63364-1:2022
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Released: 2023-02-02
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185.92 EUR
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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2023-04-05
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BS EN IEC 62435-9:2021
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Released: 2021-10-11
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22.40 EUR
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25/30511310 DC
Draft BS EN 62047-56 Micro-electromechanical devices Part 56. Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor
Draft BS EN 62047-56 Micro-electromechanical devices Part 56. Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor
Released: 2025-07-21
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25/30461045 DC
Draft BS EN 63464-1 Medical electrical equipment Particular requirements for the basic safety and essential performance of neutron capture therapy equipment
Draft BS EN 63464-1 Medical electrical equipment Particular requirements for the basic safety and essential performance of neutron capture therapy equipment
Released: 2025-11-13
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25/30510415 DC
Draft BS EN 63551-5 Semiconductor devices - Detection modules of autonomous land vehicle Part 5: Testing methods of performance for ultrasonic modules
Draft BS EN 63551-5 Semiconductor devices - Detection modules of autonomous land vehicle Part 5: Testing methods of performance for ultrasonic modules
Released: 2025-11-13
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25/30510419 DC
Draft BS EN 63551-6 Semiconductor devices - Detection modules of autonomous land vehicle Part 6: Testing methods of performance for visual imaging modules
Draft BS EN 63551-6 Semiconductor devices - Detection modules of autonomous land vehicle Part 6: Testing methods of performance for visual imaging modules
Released: 2025-11-13
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26/30551649 DC
BS EN IEC 60749-29 Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
BS EN IEC 60749-29 Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
Released: 2026-01-30
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BS EN IEC 62007-2:2025 - TC
Tracked Changes. Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Tracked Changes. Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Released: 2025-10-10
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BS EN IEC 60749-22-2:2026
Semiconductor devices — Mechanical and climatic test methods Bond strength — Wire bond shear test methods
Semiconductor devices — Mechanical and climatic test methods Bond strength — Wire bond shear test methods
Released: 2026-01-21
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304.64 EUR
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BS IEC 60747-5-15:2022
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy
Released: 2022-07-19
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176.96 EUR
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