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25/30511310 DC
Draft BS EN 62047-56 Micro-electromechanical devices Part 56. Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor
Draft BS EN 62047-56 Micro-electromechanical devices Part 56. Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor
Released: 2025-07-21
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22.40 EUR
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22.40 EUR
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BS EN IEC 60749-5:2024
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Released: 2024-02-06
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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2023-04-05
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BS EN IEC 63364-1:2022
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Released: 2023-02-02
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BS IEC 60747-5-4:2022 - TC
Tracked Changes. Semiconductor devices Optoelectronic devices. Semiconductor lasers
Tracked Changes. Semiconductor devices Optoelectronic devices. Semiconductor lasers
Released: 2023-10-31
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405.44 EUR
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BS EN IEC 62007-2:2025 - TC
Tracked Changes. Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Tracked Changes. Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Released: 2025-10-10
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BS IEC 60747-14-2:2000
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors Hall elements
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors Hall elements
Released: 2001-05-15
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BS EN 60749-34:2010
Semiconductor devices. Mechanical and climatic test methods Power cycling
Semiconductor devices. Mechanical and climatic test methods Power cycling
Released: 2011-02-28
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150.08 EUR
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BS IEC 62951-5:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
Released: 2019-03-05
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BS EN 60749-35:2006
Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components
Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components
Released: 2006-11-30
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BS EN 60749-9:2017
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
Released: 2017-11-27
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