PRICES include / exclude VAT
31.080.01 Semiconductor devices in general
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
24/30501951 DC
BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Released: 2024-11-29
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
22.40 EUR
English Hardcopy
In stock
22.40 EUR
24/30502824 DC
BS EN IEC 60749-22-1 Semiconductor devices - Mechanical and climatic test methods Part 22-1: Bond strength - wire bond pull test methods
BS EN IEC 60749-22-1 Semiconductor devices - Mechanical and climatic test methods Part 22-1: Bond strength - wire bond pull test methods
Released: 2024-12-13
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
22.40 EUR
English Hardcopy
In stock
22.40 EUR
25/30510337 DC
Draft BS EN 63378-4 Thermal standardization on semiconductor packages Part 4. Thermal evaluation board specifications for fine pitch semiconductor packages
Draft BS EN 63378-4 Thermal standardization on semiconductor packages Part 4. Thermal evaluation board specifications for fine pitch semiconductor packages
Released: 2025-03-04
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
22.40 EUR
English Hardcopy
In stock
22.40 EUR
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
259.84 EUR
English Hardcopy
In stock
259.84 EUR
BS IEC 60747-1:2006+A1:2010
Semiconductor devices General
Semiconductor devices General
Released: 2010-07-31
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
342.72 EUR
English Hardcopy
In stock
342.72 EUR
PD ES 59008-5-1:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Released: 2001-07-15
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
159.04 EUR
English Hardcopy
In stock
159.04 EUR
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
185.92 EUR
English Hardcopy
In stock
185.92 EUR
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
22.40 EUR
English Hardcopy
In stock
22.40 EUR
PD ES 59008-4-1:2001
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Released: 2001-03-15
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
159.04 EUR
English Hardcopy
In stock
159.04 EUR
BS EN 60745-1:2009+A11:2010
Hand-held motor-operated electric tools. Safety General requirements
Hand-held motor-operated electric tools. Safety General requirements
Released: 2011-02-28
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
389.76 EUR
English Hardcopy
In stock
389.76 EUR
BS EN 60749-14:2003
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Released: 2003-12-15
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
185.92 EUR
English Hardcopy
In stock
185.92 EUR
BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Released: 2008-10-31
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
259.84 EUR
English Hardcopy
In stock
259.84 EUR