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31.080.01 Semiconductor devices in general
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24/30501951 DC
BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Released: 2024-11-29
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BS EN IEC 60749-7:2026
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
Released: 2026-01-21
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BS EN IEC 60749-24:2026
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Released: 2026-01-21
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26/30510433 DC
Draft BS EN 62047-54 Ed.1.0 Micro-electromechanical devices Part 54: Silicon based MEMS fabrication technology - Test method of microstructure tensile
Draft BS EN 62047-54 Ed.1.0 Micro-electromechanical devices Part 54: Silicon based MEMS fabrication technology - Test method of microstructure tensile
Released: 2026-01-09
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BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Released: 2008-10-31
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BS EN 60749-11:2002
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Released: 2003-10-24
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159.04 EUR
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BS EN IEC 60191-1:2018
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Released: 2018-04-30
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BS EN 60749-14:2003
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Released: 2003-12-15
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BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Released: 2011-09-30
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BS EN 62418:2010
Semiconductor devices. Metallization stress void test
Semiconductor devices. Metallization stress void test
Released: 2010-08-31
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BS EN 60745-1:2009+A11:2010
Hand-held motor-operated electric tools. Safety General requirements
Hand-held motor-operated electric tools. Safety General requirements
Released: 2011-02-28
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