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31.080.01 Semiconductor devices in general
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25/30510337 DC
Draft BS EN 63378-4 Thermal standardization on semiconductor packages Part 4. Thermal evaluation board specifications for fine pitch semiconductor packages
Draft BS EN 63378-4 Thermal standardization on semiconductor packages Part 4. Thermal evaluation board specifications for fine pitch semiconductor packages
Released: 2025-03-04
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23.20 EUR
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23.20 EUR
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255.20 EUR
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255.20 EUR
BS IEC 60747-1:2006+A1:2010
Semiconductor devices General
Semiconductor devices General
Released: 2010-07-31
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336.40 EUR
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336.40 EUR
BS EN 60745-1:2009+A11:2010
Hand-held motor-operated electric tools. Safety General requirements
Hand-held motor-operated electric tools. Safety General requirements
Released: 2011-02-28
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382.80 EUR
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382.80 EUR
PD ES 59008-4-1:2001
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Released: 2001-03-15
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155.44 EUR
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155.44 EUR
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23.20 EUR
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PD ES 59008-5-1:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Released: 2001-07-15
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155.44 EUR
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155.44 EUR
PD IEC/TR 63133:2017
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Released: 2018-01-29
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183.28 EUR
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183.28 EUR
BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Released: 2008-10-31
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255.20 EUR
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255.20 EUR
BS EN 60749-14:2003
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Released: 2003-12-15
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183.28 EUR
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BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Released: 2011-09-30
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255.20 EUR
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BS EN 62415:2010
Semiconductor devices. Constant current electromigration test
Semiconductor devices. Constant current electromigration test
Released: 2010-07-31
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155.44 EUR
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155.44 EUR