PRICES include / exclude VAT
31.080.01 Semiconductor devices in general
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
24/30502824 DC
BS EN IEC 60749-22-1 Semiconductor devices - Mechanical and climatic test methods Part 22-1: Bond strength - wire bond pull test methods
BS EN IEC 60749-22-1 Semiconductor devices - Mechanical and climatic test methods Part 22-1: Bond strength - wire bond pull test methods
Released: 2024-12-13
English Secure PDF
Immediate download
27.29 USD
English Hardcopy
In stock
27.29 USD
BS EN 60745-1:2009+A11:2010
Hand-held motor-operated electric tools. Safety General requirements
Hand-held motor-operated electric tools. Safety General requirements
Released: 2011-02-28
English Secure PDF
Immediate download
450.35 USD
English Hardcopy
In stock
450.35 USD
English Secure PDF
Immediate download
300.24 USD
English Hardcopy
In stock
300.24 USD
BS IEC 60747-1:2006+A1:2010
Semiconductor devices General
Semiconductor devices General
Released: 2010-07-31
English Secure PDF
Immediate download
395.76 USD
English Hardcopy
In stock
395.76 USD
PD ES 59008-5-1:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Released: 2001-07-15
English Secure PDF
Immediate download
182.87 USD
English Hardcopy
In stock
182.87 USD
English Secure PDF
Immediate download
215.62 USD
English Hardcopy
In stock
215.62 USD
PD ES 59008-4-1:2001
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Released: 2001-03-15
English Secure PDF
Immediate download
182.87 USD
English Hardcopy
In stock
182.87 USD
English Secure PDF
Immediate download
27.29 USD
English Hardcopy
In stock
27.29 USD
BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Released: 2008-10-31
English Secure PDF
Immediate download
300.24 USD
English Hardcopy
In stock
300.24 USD
BS EN 60749-11:2002
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Released: 2003-10-24
English Secure PDF
Immediate download
182.87 USD
English Hardcopy
In stock
182.87 USD
BS EN IEC 60191-1:2018
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Released: 2018-04-30
English Secure PDF
Immediate download
352.09 USD
English Hardcopy
In stock
352.09 USD
BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Released: 2017-11-28
English Secure PDF
Immediate download
215.62 USD
English Hardcopy
In stock
215.62 USD