PRICES include / exclude VAT
31.080.99 Other semiconductor devices
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
18/30383935 DC
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2018-12-04
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
22.40 EUR
English Hardcopy
In stock
22.40 EUR
BS EN 62047-14:2012
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Released: 2012-05-31
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
176.96 EUR
English Hardcopy
In stock
176.96 EUR
BS EN 62047-21:2014
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials
Released: 2014-10-31
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
176.96 EUR
English Hardcopy
In stock
176.96 EUR
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
246.40 EUR
English Hardcopy
In stock
246.40 EUR
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
246.40 EUR
English Hardcopy
In stock
246.40 EUR
PD IEC TR 60747-5-12:2021
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
Released: 2021-11-19
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
369.60 EUR
English Hardcopy
In stock
369.60 EUR
22/30430766 DC
BS EN 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
BS EN 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
Released: 2022-05-05
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
40.32 EUR
English Hardcopy
In stock
40.32 EUR
BS IEC 62047-41:2021
Semiconductor devices. Micro-electromechanical devices RF MEMS circulators and isolators
Semiconductor devices. Micro-electromechanical devices RF MEMS circulators and isolators
Released: 2021-06-28
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
288.96 EUR
English Hardcopy
In stock
288.96 EUR
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
22.40 EUR
English Hardcopy
In stock
22.40 EUR
BS EN 60747-16-5:2013+A1:2020
Semiconductor devices Microwave integrated circuits. Oscillators
Semiconductor devices Microwave integrated circuits. Oscillators
Released: 2020-09-24
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
324.80 EUR
English Hardcopy
In stock
324.80 EUR
BS EN IEC 60904-4:2020
Photovoltaic devices Reference solar devices. Procedures for establishing calibration traceability
Photovoltaic devices Reference solar devices. Procedures for establishing calibration traceability
Released: 2020-10-19
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
288.96 EUR
English Hardcopy
In stock
288.96 EUR
BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
176.96 EUR
English Hardcopy
In stock
176.96 EUR