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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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176.96 EUR
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22.40 EUR
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PD IEC TR 60747-5-12:2021
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
Released: 2021-11-19
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369.60 EUR
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22/30430766 DC
BS EN 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
BS EN 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
Released: 2022-05-05
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25/30508761 DC
BS EN IEC 60747-5-13/AMD1 Amendment 1 - Semiconductor devices Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
BS EN IEC 60747-5-13/AMD1 Amendment 1 - Semiconductor devices Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
Released: 2025-02-28
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PD IEC TR 63571:2025
Semiconductor devices. Estimation method for lifetime conversion from “PART” to “SYSTEM”
Semiconductor devices. Estimation method for lifetime conversion from “PART” to “SYSTEM”
Released: 2025-05-16
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24/30500239 DC
BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
Released: 2024-09-13
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24/30499096 DC
BS EN IEC 63602 Guidelines for Representing Switching Losses of SIC MOSFETs in Datasheets (Fast track)
BS EN IEC 63602 Guidelines for Representing Switching Losses of SIC MOSFETs in Datasheets (Fast track)
Released: 2024-10-04
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24/30500231 DC
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor devices
Released: 2024-09-13
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