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BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Released: 2008-10-31
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255.20 EUR
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255.20 EUR
PD CLC/TR 62258-3:2007
Semiconductor die products Recommendations for good practice in handling, packing and storage
Semiconductor die products Recommendations for good practice in handling, packing and storage
Released: 2008-05-31
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336.40 EUR
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336.40 EUR
BS EN 60745-1:2009+A11:2010
Hand-held motor-operated electric tools. Safety General requirements
Hand-held motor-operated electric tools. Safety General requirements
Released: 2011-02-28
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382.80 EUR
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382.80 EUR
BS EN 60747-16-3:2002+A2:2017
Semiconductor devices Microwave integrated circuits. Frequency converters
Semiconductor devices Microwave integrated circuits. Frequency converters
Released: 2018-02-23
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354.96 EUR
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354.96 EUR
BS EN 62047-18:2013
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
Released: 2013-10-31
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183.28 EUR
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183.28 EUR
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255.20 EUR
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255.20 EUR
BS EN 62047-26:2016
Semiconductor devices. Micro-electromechanical devices Description and measurement methods for micro trench and needle structures
Semiconductor devices. Micro-electromechanical devices Description and measurement methods for micro trench and needle structures
Released: 2016-05-31
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299.28 EUR
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BS EN 62047-13:2012
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Released: 2012-05-31
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183.28 EUR
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183.28 EUR
BS EN 62047-15:2015
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
Released: 2015-07-31
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BS EN IEC 60747-17:2020
Semiconductor devices Magnetic and capacitive coupler for basic and reinforced insulation
Semiconductor devices Magnetic and capacitive coupler for basic and reinforced insulation
Released: 2021-02-03
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354.96 EUR
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354.96 EUR
PD IEC/TR 62258-7:2007
Semiconductor die products XML schema for data exchange
Semiconductor die products XML schema for data exchange
Released: 2007-11-30
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255.20 EUR
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255.20 EUR
BS EN 62047-19:2013
Semiconductor devices. Micro-electromechanical devices Electronic compasses
Semiconductor devices. Micro-electromechanical devices Electronic compasses
Released: 2013-10-31
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299.28 EUR
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299.28 EUR