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>ICS codes>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general

31.080.01 Semiconductor devices in general

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99 results
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UNE EN 62415:2010
Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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59.40 EUR
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59.40 EUR
UNE EN 62779-2:2016
Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances (Endorsed by AENOR in July of 2016.)
Released: 2016-07-01
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71.50 EUR
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71.50 EUR
UNE EN IEC 60749-41:2020
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (Endorsed by Asociación Española de Normalización in October of 2020.)
Released: 2020-10-01
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82.50 EUR
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82.50 EUR
UNE EN IEC 60749-10:2022
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.)
Released: 2022-07-01
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67.10 EUR
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67.10 EUR
UNE EN IEC 60749-37:2022
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (Endorsed by Asociación Española de Normalización in January of 2023.)
Released: 2023-01-01
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80.30 EUR
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80.30 EUR
UNE EN IEC 63287-2:2023
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (Endorsed by Asociación Española de Normalización in June of 2023.)
Released: 2023-06-01
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72.60 EUR
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72.60 EUR
UNE EN IEC 63287-1:2021
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (Endorsed by Asociación Española de Normalización in November of 2021.)
Released: 2021-11-01
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106.70 EUR
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106.70 EUR
UNE EN IEC 60749-39:2022
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (Endorsed by Asociación Española de Normalización in March of 2022.)
Released: 2022-03-01
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72.60 EUR
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72.60 EUR
UNE EN IEC 60747-17:2020
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation (Endorsed by Asociación Española de Normalización in January of 2021.)
Released: 2021-01-01
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118.80 EUR
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118.80 EUR
UNE EN IEC 60749-22-2:2026
Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods (Endorsed by Asociación Española de Normalización in February of 2026.)
Released: 2026-02-01
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95.70 EUR
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95.70 EUR
UNE EN IEC 60749-22-1:2026
Semiconductor devices - Mechanical and climatic test methods - Part 22-1: Bond strength - Wire bond pull test methods (Endorsed by Asociación Española de Normalización in February of 2026.)
Released: 2026-02-01
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129.80 EUR
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129.80 EUR
UNE EN IEC 60749-23:2026
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (Endorsed by Asociación Española de Normalización in March of 2026.)
Released: 2026-03-01
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61.60 EUR
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61.60 EUR
99 results
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