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31.080.01 Semiconductor devices in general
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BS EN IEC 63287-1:2021
Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability qualification
Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability qualification
Released: 2021-11-30
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BS EN IEC 60749-37:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Released: 2022-12-20
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365.12 EUR
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22.40 EUR
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25/30513804 DC
Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers Part 1. Classification of defects
Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers Part 1. Classification of defects
Released: 2025-03-25
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BS IEC 63378-2-1:2024
Thermal standardization on semiconductor packages 3D thermal simulation models of semiconductor packages for steady-state analysis. Discrete packages
Thermal standardization on semiconductor packages 3D thermal simulation models of semiconductor packages for steady-state analysis. Discrete packages
Released: 2024-10-29
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BS EN IEC 60749-10:2022
Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Released: 2022-08-16
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24/30495067 DC
BS EN 60601-2-93 Medical electrical equipment Part 2-93: Particular requirements for the basic safety and essential performance of neutron capture therapy equipment
BS EN 60601-2-93 Medical electrical equipment Part 2-93: Particular requirements for the basic safety and essential performance of neutron capture therapy equipment
Released: 2024-06-14
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BS EN IEC 60749-23:2026
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Released: 2026-02-03
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BS EN IEC 60749-24:2026 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Released: 2026-02-02
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26/30553853 DC
Draft BS EN IEC 60747-5-6/AMD1 ED2 Amendment 1 - Semiconductor devices
Draft BS EN IEC 60747-5-6/AMD1 ED2 Amendment 1 - Semiconductor devices
Released: 2026-01-27
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26/30544424 DC
Draft BS EN 62047-59 Ed.1.0 Micro-electromechanical systems Part 59: Test methods for performances of MEMS multi-orifice balanced differential pressure flowmeter
Draft BS EN 62047-59 Ed.1.0 Micro-electromechanical systems Part 59: Test methods for performances of MEMS multi-orifice balanced differential pressure flowmeter
Released: 2026-02-11
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