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31.080.01 Semiconductor devices in general
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BS EN IEC 60749-18:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Released: 2020-11-03
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357.28 EUR
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357.28 EUR
BS EN IEC 60749-17:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2020-02-24
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218.08 EUR
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218.08 EUR
BS EN 62779-1:2016
Semiconductor devices. Semiconductor interface for human body communication General requirements
Semiconductor devices. Semiconductor interface for human body communication General requirements
Released: 2016-06-30
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183.28 EUR
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183.28 EUR
BS EN 60749-29:2011
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Semiconductor devices. Mechanical and climatic test methods Latch-up test
Released: 2011-08-31
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255.20 EUR
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255.20 EUR
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183.28 EUR
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183.28 EUR
BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods Sealing
Semiconductor devices. Mechanical and climatic test methods Sealing
Released: 2003-07-03
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183.28 EUR
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BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Released: 2002-09-24
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155.44 EUR
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155.44 EUR
BS IEC 60747-14-4:2011
Semiconductor devices. Discrete devices Semiconductor accelerometers
Semiconductor devices. Discrete devices Semiconductor accelerometers
Released: 2011-02-28
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382.80 EUR
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382.80 EUR
BS IEC 60747-14-10:2019
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
Released: 2019-11-22
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299.28 EUR
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299.28 EUR
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255.20 EUR
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255.20 EUR
BS IEC 62951-8:2023
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for stretchability, flexibility, and stability of flexible resistive memory
Released: 2023-01-24
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183.28 EUR
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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Released: 2023-04-05
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183.28 EUR
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183.28 EUR