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BS EN 62047-15:2015
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
Released: 2015-07-31
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BS EN 62047-13:2012
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Released: 2012-05-31
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BS EN IEC 63244-1:2021
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Released: 2021-11-05
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BS EN IEC 62031:2020+A11:2021
LED modules for general lighting. Safety specifications
LED modules for general lighting. Safety specifications
Released: 2022-03-31
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BS IEC 62047-27:2017
Semiconductor devices. Micro-electromechanical devices Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)
Semiconductor devices. Micro-electromechanical devices Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)
Released: 2020-07-22
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BS IEC 62830-1:2017
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based piezoelectric energy harvesting
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based piezoelectric energy harvesting
Released: 2020-07-21
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BS IEC 60747-5-13:2021
Semiconductor devices Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
Semiconductor devices Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
Released: 2021-06-28
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23/30479765 DC
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
Released: 2023-09-25
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BS IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Released: 2023-08-31
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BS EN IEC 63287-2:2023
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
Released: 2023-05-23
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