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BS IEC 62047-38:2021
Semiconductor devices. Micro-electromechanical devices Test method for adhesion strength of metal powder paste in MEMS interconnection
Semiconductor devices. Micro-electromechanical devices Test method for adhesion strength of metal powder paste in MEMS interconnection
Released: 2021-07-07
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176.96 EUR
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288.96 EUR
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BS IEC 62047-40:2021
Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold
Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold
Released: 2021-09-14
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150.08 EUR
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150.08 EUR
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22.40 EUR
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22.40 EUR
BS IEC 62047-48:2024
Semiconductor devices. Micro-electromechanical devices Test method for determining solution concentration by optical absorption using MEMS fluidic device
Semiconductor devices. Micro-electromechanical devices Test method for determining solution concentration by optical absorption using MEMS fluidic device
Released: 2024-06-11
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BS EN IEC 60747-16-9:2024
Semiconductor devices Microwave integrated circuits. Phase shifters
Semiconductor devices Microwave integrated circuits. Phase shifters
Released: 2024-11-20
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BS IEC 60747-5-14:2022
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the surface temperature based on the thermoreflectance method
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the surface temperature based on the thermoreflectance method
Released: 2024-09-26
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BS EN IEC 60747-15:2024
Semiconductor devices Discrete devices. Isolated power semiconductor devices
Semiconductor devices Discrete devices. Isolated power semiconductor devices
Released: 2024-12-03
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342.72 EUR
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BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Released: 2008-10-31
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BS EN 60747-16-4:2004+A2:2017
Semiconductor devices Microwave integrated circuits. Switches
Semiconductor devices Microwave integrated circuits. Switches
Released: 2018-03-16
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324.80 EUR
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BS EN 62047-18:2013
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
Released: 2013-10-31
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176.96 EUR
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246.40 EUR
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246.40 EUR