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CSN EN IEC 60747-16-6
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
Released: 01.02.2020
English Hardcopy
In stock
69.00 EUR
CSN EN 62435-1
Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
Released: 01.09.2017
English Hardcopy
In stock
84.00 EUR
CSN EN 60749-4 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Released: 01.10.2017
English Hardcopy
In stock
52.00 EUR
CSN IEC 62830-1
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
Released: 01.11.2017
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 60749-26 ed. 3
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Released: 01.08.2018
English Hardcopy
In stock
98.00 EUR
CSN EN IEC 60191-1 ed. 2
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
Released: 01.10.2018
English Hardcopy
In stock
92.00 EUR
CSN EN IEC 60749-37 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Released: 01.06.2023
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 60747-16-7
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
Released: 01.07.2023
English Hardcopy
In stock
92.00 EUR
CSN EN 60747-16-5
Semiconductor devices - Part 16- 5: Microwave integrated circuits - Oscillators
Semiconductor devices - Part 16- 5: Microwave integrated circuits - Oscillators
Released: 01.03.2014
English Hardcopy
In stock
92.00 EUR
CSN EN 62047-21
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
Released: 01.04.2015
English Hardcopy
In stock
61.00 EUR
CSN EN 62047-20
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
Released: 01.04.2015
English Hardcopy
In stock
98.00 EUR