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31.080.01 Semiconductor devices in general
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BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Released: 2002-09-24
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154.10 EUR
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154.10 EUR
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181.70 EUR
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181.70 EUR
BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods Sealing
Semiconductor devices. Mechanical and climatic test methods Sealing
Released: 2003-07-03
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181.70 EUR
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181.70 EUR
BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2019-05-15
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154.10 EUR
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154.10 EUR
BS EN 62298-3:2005
Teleweb application Superteletext profile
Teleweb application Superteletext profile
Released: 2005-10-14
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379.50 EUR
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379.50 EUR
BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete devices and integrated circuits
Semiconductor devices Generic specification for discrete devices and integrated circuits
Released: 2011-07-31
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296.70 EUR
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296.70 EUR
BS IEC 60747-14-10:2019
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
Released: 2019-11-22
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296.70 EUR
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296.70 EUR
BS EN IEC 62435-9:2021
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Released: 2021-10-11
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181.70 EUR
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181.70 EUR
22/30443234 DC
BS EN 63378-3. Thermal standardization on semiconductor packages Part 3. Thermal circuit simulation models of semiconductor packages for transient analysis
BS EN 63378-3. Thermal standardization on semiconductor packages Part 3. Thermal circuit simulation models of semiconductor packages for transient analysis
Released: 2022-01-24
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23.00 EUR
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23.00 EUR
BS IEC 62830-5:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test method for measuring generated power from flexible thermoelectric devices
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test method for measuring generated power from flexible thermoelectric devices
Released: 2021-02-03
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181.70 EUR
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181.70 EUR
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253.00 EUR
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253.00 EUR
BS EN IEC 60749-17:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2020-02-24
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216.20 EUR
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216.20 EUR