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31.080.01 Semiconductor devices in general
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BS EN 60749-35:2006
Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components
Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components
Released: 2006-11-30
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253.00 EUR
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253.00 EUR
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23.00 EUR
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23.00 EUR
BS EN IEC 60749-37:2022
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Released: 2022-11-22
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253.00 EUR
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253.00 EUR
BS EN IEC 62007-1:2015+A1:2022
Semiconductor optoelectronic devices for fibre optic system applications Specification template for essential ratings and characteristics
Semiconductor optoelectronic devices for fibre optic system applications Specification template for essential ratings and characteristics
Released: 2022-11-24
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296.70 EUR
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296.70 EUR
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181.70 EUR
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181.70 EUR
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494.50 EUR
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494.50 EUR
BS EN IEC 60749-15:2020
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Released: 2020-10-01
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181.70 EUR
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181.70 EUR
BS EN IEC 60749-30:2020
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
Released: 2020-09-30
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181.70 EUR
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BS EN IEC 60749-5:2024 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Released: 2024-02-09
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255.30 EUR
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255.30 EUR
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23.00 EUR
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23.00 EUR
24/30501951 DC
BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Released: 2024-11-29
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23.00 EUR
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24/30502824 DC
BS EN IEC 60749-22-1 Semiconductor devices - Mechanical and climatic test methods Part 22-1: Bond strength - wire bond pull test methods
BS EN IEC 60749-22-1 Semiconductor devices - Mechanical and climatic test methods Part 22-1: Bond strength - wire bond pull test methods
Released: 2024-12-13
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23.00 EUR
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