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>ICS codes>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general

31.080.01 Semiconductor devices in general

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94 results
First page124678Last page
UNE EN IEC 60749-12:2018
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (Endorsed by Asociación Española de Normalización in April of 2018.)
Released: 2018-04-01
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46.20 EUR
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46.20 EUR
UNE EN IEC 60747-17:2020/AC:2021-02
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation (Endorsed by Asociación Española de Normalización in March of 2021.)
Released: 2021-03-01
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2.19 EUR
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2.19 EUR
UNE 21302-521:2004
International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
Released: 2004-05-21
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147.40 EUR
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147.40 EUR
UNE EN 60749-11:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method.
Released: 2003-05-30
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62.04 EUR
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62.04 EUR
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51.70 EUR
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51.70 EUR
UNE EN 60749-25:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
Released: 2004-06-11
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77.88 EUR
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77.88 EUR
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64.90 EUR
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64.90 EUR
UNE EN 60749-31:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)
Released: 2004-03-18
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36.96 EUR
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36.96 EUR
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30.80 EUR
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30.80 EUR
UNE EN 60749-8:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 8: Sealing
Released: 2004-05-28
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81.84 EUR
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81.84 EUR
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68.20 EUR
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68.20 EUR
UNE EN 61975:2010
High-voltage direct current (HVDC) installations - System tests (Endorsed by AENOR in January of 2012.)
Released: 2012-01-01
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125.40 EUR
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125.40 EUR
UNE EN 60749-27:2006/A1:2012
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)
Released: 2013-01-01
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16.50 EUR
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16.50 EUR
UNE EN 60749-35:2006
Semiconductor devices - Mechanical and climatic test methods -- Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006) (Endorsed by AENOR in January of 2007.)
Released: 2007-01-01
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74.80 EUR
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74.80 EUR
UNE EN 60749-5:2017
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in August of 2017.)
Released: 2017-08-01
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46.20 EUR
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46.20 EUR
UNE EN 60749-7:2011
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (Endorsed by AENOR in December of 2011.)
Released: 2011-12-01
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62.70 EUR
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62.70 EUR
94 results
First page124678Last page