PRICES include / exclude VAT
31.080.01 Semiconductor devices in general
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
UNE EN 60749-21:2011
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by AENOR in November of 2011.)
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by AENOR in November of 2011.)
Released: 2011-11-01
English PDF
Immediate download
74.80 EUR
English Hardcopy
In stock
74.80 EUR
English PDF
Immediate download
41.80 EUR
English Hardcopy
In stock
41.80 EUR
English PDF
Immediate download
99.00 EUR
English Hardcopy
In stock
99.00 EUR
English PDF
Immediate download
62.70 EUR
English Hardcopy
In stock
62.70 EUR
UNE EN IEC 60747-5-5:2020
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
Released: 2020-10-01
English PDF
Immediate download
105.60 EUR
English Hardcopy
In stock
105.60 EUR
UNE EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
Released: 2003-11-21
English PDF
Immediate download
62.04 EUR
English Hardcopy
In stock
62.04 EUR
Spanish PDF
Immediate download
51.70 EUR
Spanish Hardcopy
In stock
51.70 EUR
English PDF
Immediate download
30.80 EUR
English Hardcopy
In stock
30.80 EUR
English PDF
Immediate download
99.00 EUR
English Hardcopy
In stock
99.00 EUR
UNE EN 60749-14:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Released: 2004-06-11
English PDF
Immediate download
79.20 EUR
English Hardcopy
In stock
79.20 EUR
Spanish PDF
Immediate download
66.00 EUR
Spanish Hardcopy
In stock
66.00 EUR
UNE EN 60749-19:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Released: 2003-11-21
English PDF
Immediate download
46.20 EUR
English Hardcopy
In stock
46.20 EUR
Spanish PDF
Immediate download
38.50 EUR
Spanish Hardcopy
In stock
38.50 EUR
UNE EN 60749-2:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Released: 2003-05-30
English PDF
Immediate download
52.80 EUR
English Hardcopy
In stock
52.80 EUR
Spanish PDF
Immediate download
44.00 EUR
Spanish Hardcopy
In stock
44.00 EUR
UNE EN 60749-24:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Released: 2005-03-16
English PDF
Immediate download
62.04 EUR
English Hardcopy
In stock
62.04 EUR
Spanish PDF
Immediate download
51.70 EUR
Spanish Hardcopy
In stock
51.70 EUR