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31.080.01 Semiconductor devices in general
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81.40 EUR
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81.40 EUR
UNE EN 60749-21:2011
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by AENOR in November of 2011.)
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by AENOR in November of 2011.)
Released: 2011-11-01
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74.80 EUR
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74.80 EUR
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41.80 EUR
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41.80 EUR
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62.70 EUR
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62.70 EUR
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99.00 EUR
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99.00 EUR
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99.00 EUR
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99.00 EUR
UNE EN IEC 60747-5-5:2020
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
Released: 2020-10-01
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105.60 EUR
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105.60 EUR
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30.80 EUR
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30.80 EUR
UNE EN 60749-14:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Released: 2004-06-11
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79.20 EUR
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79.20 EUR
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66.00 EUR
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66.00 EUR
UNE EN 60749-19:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Released: 2003-11-21
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46.20 EUR
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46.20 EUR
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38.50 EUR
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38.50 EUR
UNE EN 60749-2:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Released: 2003-05-30
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52.80 EUR
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52.80 EUR
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44.00 EUR
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44.00 EUR
UNE EN 60749-24:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Released: 2005-03-16
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62.04 EUR
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62.04 EUR
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51.70 EUR
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51.70 EUR