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31.080.01 Semiconductor devices in general
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BS EN IEC 60749-18:2019
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Released: 2019-06-10
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PD ES 59008-5-2:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die with added connection structures
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die with added connection structures
Released: 2001-06-15
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154.10 EUR
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154.10 EUR
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181.70 EUR
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181.70 EUR
BS EN 62374-1:2010
Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Released: 2011-06-30
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13/30290462 DC
BS EN 60191-1. Mechanical standardization of semiconductor devices. Part 1. General rules for the preparation of outline drawings of discrete devices
BS EN 60191-1. Mechanical standardization of semiconductor devices. Part 1. General rules for the preparation of outline drawings of discrete devices
Released: 2013-09-10
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23.00 EUR
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154.10 EUR
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BS EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
Released: 2004-06-24
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154.10 EUR
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154.10 EUR
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181.70 EUR
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BS IEC 60747-18-3:2019
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
Released: 2020-01-14
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22/30443678 DC
BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods Part 34-1. Power cycling test for power semiconductor module
BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods Part 34-1. Power cycling test for power semiconductor module
Released: 2022-03-30
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BS EN IEC 63287-1:2021
Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability qualification
Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability qualification
Released: 2021-11-30
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333.50 EUR
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