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25/30513804 DC
Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers Part 1. Classification of defects
Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers Part 1. Classification of defects
Released: 2025-03-25
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23.20 EUR
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23.20 EUR
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155.44 EUR
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155.44 EUR
BS EN 62007-2:2009
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Released: 2009-10-31
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299.28 EUR
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299.28 EUR
BS EN 61582:2006
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
Released: 2006-06-30
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354.96 EUR
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354.96 EUR
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255.20 EUR
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255.20 EUR
BS IEC 62615:2010
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Released: 2011-07-31
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255.20 EUR
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BS EN 62298-3:2005
Teleweb application Superteletext profile
Teleweb application Superteletext profile
Released: 2005-10-14
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382.80 EUR
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382.80 EUR
BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete devices and integrated circuits
Semiconductor devices Generic specification for discrete devices and integrated circuits
Released: 2011-07-31
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BS 7241:1989
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
Released: 1990-03-30
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382.80 EUR
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382.80 EUR
BS EN 60749-24:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Released: 2004-06-24
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BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2019-05-15
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155.44 EUR
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155.44 EUR
BS EN 60191-6:2009
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages
Released: 2010-04-30
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299.28 EUR
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