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CSN EN IEC 60749-13 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Released: 01.10.2018
English Hardcopy
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61.00 EUR
CSN EN IEC 60747-16-8
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
Released: 01.07.2023
English Hardcopy
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84.00 EUR
CSN EN IEC 63287-2
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Released: 01.12.2023
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 63378-3
Thermal standardization on semiconductor packages - Part 3: Thermal circuit simulation models of discrete semiconductor packages for transient analysis
Thermal standardization on semiconductor packages - Part 3: Thermal circuit simulation models of discrete semiconductor packages for transient analysis
Released: 01.12.2025
English Hardcopy
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61.00 EUR
CSN EN 62341-1-1
Organic light emitting diode (OLED) displays - Part 1-1: Generic specifications
Organic light emitting diode (OLED) displays - Part 1-1: Generic specifications
Released: 01.05.2010
English Hardcopy
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69.00 EUR
CSN EN 62416
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
Released: 01.12.2010
English Hardcopy
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52.00 EUR
CSN EN 61747-5-3
Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability
Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability
Released: 01.12.2010
English Hardcopy
In stock
69.00 EUR
English Hardcopy
In stock
69.00 EUR
CSN EN 62374-1
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Released: 01.07.2011
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In stock
61.00 EUR
CSN EN 60749-7 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Released: 01.02.2012
English Hardcopy
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52.00 EUR
CSN EN 61988-2-5
Plasma display panels - Part 2-5: Measuring methods - Acoustic noise
Plasma display panels - Part 2-5: Measuring methods - Acoustic noise
Released: 01.01.2013
English Hardcopy
In stock
61.00 EUR
CSN EN 61747-4 ed. 2
Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics -
Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics -
Released: 01.07.2013
English Hardcopy
In stock
52.00 EUR