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CSN EN 60749-7 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Released: 01.02.2012
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52.00 EUR
CSN EN 61988-2-5
Plasma display panels - Part 2-5: Measuring methods - Acoustic noise
Plasma display panels - Part 2-5: Measuring methods - Acoustic noise
Released: 01.01.2013
English Hardcopy
In stock
61.00 EUR
CSN EN 61747-4 ed. 2
Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics -
Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics -
Released: 01.07.2013
English Hardcopy
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52.00 EUR
CSN EN 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Released: 01.03.2007
English Hardcopy
In stock
69.00 EUR
CSN EN 62258-5
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation
Semiconductor die products - Part 5: Requirements for information concerning electrical simulation
Released: 01.06.2007
English Hardcopy
In stock
61.00 EUR
CSN EN 62374
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Released: 01.05.2008
English Hardcopy
In stock
84.00 EUR
CSN EN 60749-37
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Released: 01.09.2008
English Hardcopy
In stock
69.00 EUR
CSN EN 62132-1 ed. 2
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
Released: 01.06.2016
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84.00 EUR
CSN EN 62779-2
Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
Released: 01.10.2016
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In stock
61.00 EUR
CSN EN 62779-3
Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
Released: 01.12.2016
English Hardcopy
In stock
61.00 EUR
CSN EN 62433-4
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
Released: 01.01.2017
English Hardcopy
In stock
130.00 EUR
English Hardcopy
In stock
61.00 EUR