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CSN EN 62415
Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
Released: 01.12.2010
English Hardcopy
In stock
52.00 EUR
CSN EN 62779-1
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
Released: 01.10.2016
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 63244-1
Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
Released: 01.05.2022
English Hardcopy
In stock
84.00 EUR
CSN EN IEC 62228-7
Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
Released: 01.10.2022
English Hardcopy
In stock
92.00 EUR
CSN EN IEC 60749-10 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
Released: 01.01.2023
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 61967-8 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Released: 01.12.2023
English Hardcopy
In stock
61.00 EUR
CSN EN 61964
Integrated circuits - Memory devices pin configurations
Integrated circuits - Memory devices pin configurations
Released: 01.06.2000
English Hardcopy
In stock
92.00 EUR
CSN EN 62047-2
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
Released: 01.05.2007
English Hardcopy
In stock
69.00 EUR
CSN EN 62258-6
Semiconductor die products - Part 6: Requirements for information concerning thermal simulation
Semiconductor die products - Part 6: Requirements for information concerning thermal simulation
Released: 01.06.2007
English Hardcopy
In stock
52.00 EUR
CSN EN 60191-6-16
Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
Released: 01.01.2008
English Hardcopy
In stock
52.00 EUR
CSN EN 60749-8
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Released: 01.12.2003
English Hardcopy
In stock
84.00 EUR
CSN EN 60749-22
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Released: 01.12.2003
English Hardcopy
In stock
84.00 EUR