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CSN EN IEC 61967-8 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Released: 01.12.2023
English Hardcopy
In stock
61.00 EUR
CSN EN 61747-30-1
Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type
Liquid crystal display devices - Part 30-1: Measuring methods for liquid crystal display modules - Transmissive type
Released: 01.03.2013
English Hardcopy
In stock
92.00 EUR
CSN EN 62047-18
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
Released: 01.04.2014
English Hardcopy
In stock
61.00 EUR
CSN EN 62215-3
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Released: 01.04.2014
English Hardcopy
In stock
84.00 EUR
CSN EN 61747-4-1
Liquid crystal display devices - Part 4-1: Matrix colour LCD modules - Essential ratings and characteristics
Liquid crystal display devices - Part 4-1: Matrix colour LCD modules - Essential ratings and characteristics
Released: 01.06.2005
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-35
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
Released: 01.05.2007
English Hardcopy
In stock
92.00 EUR
English Hardcopy
In stock
69.00 EUR
CSN EN 62433-3
EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
Released: 01.09.2017
English Hardcopy
In stock
115.00 EUR
CSN EN 60749-3 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
Released: 01.10.2017
English Hardcopy
In stock
52.00 EUR
CSN EN 60749-5 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Released: 01.12.2017
English Hardcopy
In stock
52.00 EUR
CSN EN 61988-5
Plasma display panels - Part 5: Generic specification
Plasma display panels - Part 5: Generic specification
Released: 01.06.2010
English Hardcopy
In stock
69.00 EUR
English Hardcopy
In stock
84.00 EUR