PRICES include / exclude VAT
3587 Semiconductor elements
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
CSN EN 60749-8
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Released: 01.12.2003
English Hardcopy
In stock
110.00 EUR
CSN EN 60749-22
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Released: 01.12.2003
English Hardcopy
In stock
110.00 EUR
CSN EN 61967-2
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Released: 01.04.2006
English Hardcopy
In stock
125.00 EUR
CSN EN 62415
Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
Released: 01.12.2010
English Hardcopy
In stock
70.00 EUR
CSN EN 62047-8
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
Released: 01.12.2011
English Hardcopy
In stock
80.00 EUR
CSN EN 60749-21 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Released: 01.12.2011
English Hardcopy
In stock
95.00 EUR
CSN EN 62047-7
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
Released: 01.02.2012
English Hardcopy
In stock
95.00 EUR
CSN EN 61747-6-2
Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
Released: 01.03.2012
English Hardcopy
In stock
135.00 EUR
CSN EN IEC 60749-7 ed. 3
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Released: 01.06.2026
English Hardcopy
In stock
80.00 EUR
CSN EN IEC 62228-6
Integrated circuit - EMC evaluation of transceivers - Part 6: PSI5 transceivers
Integrated circuit - EMC evaluation of transceivers - Part 6: PSI5 transceivers
Released: 01.06.2023
English Hardcopy
In stock
125.00 EUR
CSN EN IEC 62435-3
Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data
Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data
Released: 01.09.2020
English Hardcopy
In stock
80.00 EUR
CSN EN IEC 62228-3
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
Released: 01.11.2019
English Hardcopy
In stock
140.00 EUR