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31.080.01 Semiconductor devices in general
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UNE 21321:1978
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
Released: 1978-06-15
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100.10 EUR
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100.10 EUR
UNE EN 60749-1:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
Released: 2004-05-28
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66.00 EUR
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66.00 EUR
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55.00 EUR
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55.00 EUR
UNE EN 60749-19:2003/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Released: 2011-01-19
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36.96 EUR
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36.96 EUR
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30.80 EUR
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30.80 EUR
UNE EN 60749-22:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 22: Bond strength
Semiconductor devices - Mechanical and climatic test methods -- Part 22: Bond strength
Released: 2004-03-26
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91.08 EUR
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91.08 EUR
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75.90 EUR
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75.90 EUR
UNE EN 60749-23:2005/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Released: 2011-12-21
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36.96 EUR
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36.96 EUR
Spanish PDF
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30.80 EUR
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30.80 EUR
English PDF
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70.40 EUR
English Hardcopy
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70.40 EUR
English PDF
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95.70 EUR
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95.70 EUR
English PDF
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77.00 EUR
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77.00 EUR
English PDF
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104.50 EUR
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In stock
104.50 EUR
English PDF
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66.00 EUR
English Hardcopy
In stock
66.00 EUR
English PDF
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75.90 EUR
English Hardcopy
In stock
75.90 EUR
English PDF
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Printable
70.40 EUR
English Hardcopy
In stock
70.40 EUR