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Main page>ICS codes>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general

31.080.01 Semiconductor devices in general

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UNE EN 60191-6-20:2010
Mechanical standardization of semiconductor devices -- Part 6-20: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline J-lead packages (SOJ) (Endorsed by AENOR in February of 2011.)
Released: 2011-02-01
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59.40 EUR
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59.40 EUR
UNE EN 60191-6-3:2000
Mechanical standardization of semiconductor devices -- Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP) (Endorsed by AENOR in December of 2001.)
Released: 2001-12-01
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71.50 EUR
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71.50 EUR
UNE EN 60191-6-4:2003
Mechanical standardization of semiconductor devices -- Part 6-4: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of ball grid array (BGA) (Endorsed by AENOR in October of 2003.)
Released: 2003-10-01
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70.40 EUR
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UNE EN 60749-27:2006
Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006) (Endorsed by AENOR in November of 2006.)
Released: 2006-11-01
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64.90 EUR
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UNE EN 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Released: 2011-11-01
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78.10 EUR
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78.10 EUR
UNE EN 60749-3:2017
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (Endorsed by Asociación Española de Normalización in July of 2017.)
Released: 2017-07-01
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59.40 EUR
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UNE 21321:1978
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
Released: 1978-06-15
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102.30 EUR
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102.30 EUR
UNE EN 60749-1:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
Released: 2004-05-28
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56.10 EUR
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56.10 EUR
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UNE EN 60749-19:2003/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Released: 2011-01-19
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35.20 EUR
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35.20 EUR
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UNE EN 60749-22:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 22: Bond strength
Released: 2004-03-26
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75.90 EUR
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75.90 EUR
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75.90 EUR
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UNE EN 60749-23:2005/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Released: 2011-12-21
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35.20 EUR
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35.20 EUR
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35.20 EUR
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UNE EN 61975:2010/A1:2017
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in March of 2017.)
Released: 2017-03-01
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73.70 EUR
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99 results
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