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31.080.01 Semiconductor devices in general
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UNE EN 60749-23:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Released: 2005-03-16
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66.00 EUR
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66.00 EUR
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55.00 EUR
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55.00 EUR
UNE EN 60749-33:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
Released: 2005-03-16
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52.80 EUR
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52.80 EUR
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44.00 EUR
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44.00 EUR
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66.00 EUR
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66.00 EUR
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81.40 EUR
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81.40 EUR
UNE EN 62416:2010
Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)
Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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50.60 EUR
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50.60 EUR
UNE EN 62417:2010
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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41.80 EUR
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41.80 EUR
UNE EN 62418:2010
Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)
Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)
Released: 2010-10-01
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69.30 EUR
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69.30 EUR
UNE EN 62779-1:2016
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements (Endorsed by AENOR in July of 2016.)
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements (Endorsed by AENOR in July of 2016.)
Released: 2016-07-01
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69.30 EUR
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69.30 EUR
English PDF
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63.80 EUR
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63.80 EUR
English PDF
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71.50 EUR
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71.50 EUR
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62.70 EUR
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62.70 EUR
English PDF
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83.60 EUR
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83.60 EUR