PRICES include / exclude VAT
31.080.01 Semiconductor devices in general
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
UNE EN IEC 60749-21:2026
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by Asociación Española de Normalización in March of 2026.)
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by Asociación Española de Normalización in March of 2026.)
Released: 2026-03-01
English PDF
Immediate download
Printable
75.90 EUR
English Hardcopy
In stock
75.90 EUR
UNE EN 60191-3:2001
Mechanical standardization of semiconductor devices -- Part 3: General rules for the preparation of outline drawings of integrated circuits.
Mechanical standardization of semiconductor devices -- Part 3: General rules for the preparation of outline drawings of integrated circuits.
Released: 2001-01-31
English PDF
Immediate download
Printable
117.70 EUR
English Hardcopy
In stock
117.70 EUR
Spanish PDF
Immediate download
Printable
117.70 EUR
Spanish Hardcopy
In stock
117.70 EUR
UNE EN 60749-14:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Released: 2004-06-11
English PDF
Immediate download
Printable
66.00 EUR
English Hardcopy
In stock
66.00 EUR
Spanish PDF
Immediate download
Printable
66.00 EUR
Spanish Hardcopy
In stock
66.00 EUR
UNE EN 60749-19:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Released: 2003-11-21
English PDF
Immediate download
Printable
38.50 EUR
English Hardcopy
In stock
38.50 EUR
Spanish PDF
Immediate download
Printable
38.50 EUR
Spanish Hardcopy
In stock
38.50 EUR
UNE EN 60749-2:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Released: 2003-05-30
English PDF
Immediate download
Printable
44.00 EUR
English Hardcopy
In stock
44.00 EUR
Spanish PDF
Immediate download
Printable
44.00 EUR
Spanish Hardcopy
In stock
44.00 EUR
UNE EN 60749-24:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Released: 2005-03-16
English PDF
Immediate download
Printable
51.70 EUR
English Hardcopy
In stock
51.70 EUR
Spanish PDF
Immediate download
Printable
51.70 EUR
Spanish Hardcopy
In stock
51.70 EUR
UNE EN 60749-32:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Released: 2004-03-18
English PDF
Immediate download
Printable
38.50 EUR
English Hardcopy
In stock
38.50 EUR
Spanish PDF
Immediate download
Printable
38.50 EUR
Spanish Hardcopy
In stock
38.50 EUR
UNE EN 60749-32:2004/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Released: 2011-01-19
English PDF
Immediate download
Printable
38.50 EUR
English Hardcopy
In stock
38.50 EUR
Spanish PDF
Immediate download
Printable
38.50 EUR
Spanish Hardcopy
In stock
38.50 EUR
UNE EN 60749-34:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
Released: 2011-07-20
English PDF
Immediate download
Printable
64.90 EUR
English Hardcopy
In stock
64.90 EUR
Spanish PDF
Immediate download
Printable
64.90 EUR
Spanish Hardcopy
In stock
64.90 EUR
UNE EN 60749-36:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
Released: 2004-03-18
English PDF
Immediate download
Printable
38.50 EUR
English Hardcopy
In stock
38.50 EUR
Spanish PDF
Immediate download
Printable
38.50 EUR
Spanish Hardcopy
In stock
38.50 EUR
UNE EN 61975:2010/A2:2022
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in January of 2023.)
High-voltage direct current (HVDC) installations - System tests (Endorsed by Asociación Española de Normalización in January of 2023.)
Released: 2023-01-01
English PDF
Immediate download
Printable
50.60 EUR
English Hardcopy
In stock
50.60 EUR
UNE EN 62007-2:2009
Semiconductor optoelectronic devices for fibre optic system applications -- Part 2: Measuring methods (Endorsed by AENOR in June of 2009.)
Semiconductor optoelectronic devices for fibre optic system applications -- Part 2: Measuring methods (Endorsed by AENOR in June of 2009.)
Released: 2009-06-01
English PDF
Immediate download
Printable
83.60 EUR
English Hardcopy
In stock
83.60 EUR