PRICES include / exclude VAT
3587 Semiconductor elements
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
CSN EN 62341-5
Organic Light Emitting Diode (OLED) displays - Part 5: Environmental testing methods
Organic Light Emitting Diode (OLED) displays - Part 5: Environmental testing methods
Released: 01.08.2010
English Hardcopy
In stock
61.00 EUR
CSN EN 62047-6
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)
Released: 01.11.2010
English Hardcopy
In stock
61.00 EUR
English Hardcopy
In stock
61.00 EUR
CSN EN 62418
Semiconductor devices - Metallization stress void test (IEC 62418:2010)
Semiconductor devices - Metallization stress void test (IEC 62418:2010)
Released: 01.01.2011
English Hardcopy
In stock
84.00 EUR
CSN EN 62047-4
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
Released: 01.05.2011
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 60747-16-6
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
Released: 01.02.2020
English Hardcopy
In stock
69.00 EUR
CSN EN 60749-27
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Released: 01.03.2007
English Hardcopy
In stock
69.00 EUR
CSN EN 62047-3
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
Released: 01.05.2007
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-38
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Released: 01.10.2008
English Hardcopy
In stock
52.00 EUR
CSN EN 60749-16
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Released: 01.11.2003
English Hardcopy
In stock
52.00 EUR
CSN EN 61967-5
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
Released: 01.12.2003
English Hardcopy
In stock
92.00 EUR
CSN EN 60749-32
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (exterrnally induced)
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (exterrnally induced)
Released: 01.12.2003
English Hardcopy
In stock
52.00 EUR