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English Hardcopy
In stock
69.00 EUR
CSN EN 62417
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
Released: 01.12.2010
English Hardcopy
In stock
52.00 EUR
CSN EN 62258-1 ed. 2
Semiconductor die products - Part 1: Procurement and use
Semiconductor die products - Part 1: Procurement and use
Released: 01.05.2011
English Hardcopy
In stock
92.00 EUR
CSN EN 61988-3-1
Plasma display panels - Part 3-1: Mechanical interface
Plasma display panels - Part 3-1: Mechanical interface
Released: 01.07.2006
English Hardcopy
In stock
69.00 EUR
CSN EN 60749-31
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Released: 01.12.2003
English Hardcopy
In stock
52.00 EUR
CSN EN 60749-24
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Released: 01.12.2004
English Hardcopy
In stock
52.00 EUR
CSN EN 60749-33
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Released: 01.12.2004
English Hardcopy
In stock
52.00 EUR
CSN EN 60191-3
Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
Released: 01.09.2000
English Hardcopy
In stock
37.00 EUR
CSN EN IEC 63373
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
Released: 01.10.2022
English Hardcopy
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61.00 EUR
English Hardcopy
In stock
92.00 EUR
CSN EN IEC 60749-18 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Released: 01.12.2019
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 60747-5-5 ed. 2
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
Released: 01.03.2021
English Hardcopy
In stock
98.00 EUR