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English Hardcopy
In stock
69.00 EUR
CSN EN 62417
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
Released: 01.12.2010
English Hardcopy
In stock
52.00 EUR
CSN EN 62258-1 ed. 2
Semiconductor die products - Part 1: Procurement and use
Semiconductor die products - Part 1: Procurement and use
Released: 01.05.2011
English Hardcopy
In stock
92.00 EUR
CSN EN IEC 63373
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
Released: 01.10.2022
English Hardcopy
In stock
61.00 EUR
English Hardcopy
In stock
92.00 EUR
CSN EN 62132-2
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
Released: 01.09.2011
English Hardcopy
In stock
69.00 EUR
CSN EN 62047-5
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
Released: 01.03.2012
English Hardcopy
In stock
84.00 EUR
English Hardcopy
In stock
69.00 EUR
CSN EN 60747-15 ed. 2
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
Released: 01.08.2012
English Hardcopy
In stock
69.00 EUR
CSN EN 62047-13
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures
Released: 01.10.2012
English Hardcopy
In stock
61.00 EUR
CSN EN 62132-8
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Released: 01.04.2013
English Hardcopy
In stock
69.00 EUR
CSN EN 61747-2-1 ed. 2
Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification
Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification
Released: 01.11.2013
English Hardcopy
In stock
61.00 EUR