PRICES include / exclude VAT
3587 Semiconductor elements
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
CSN EN 62047-8
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
Released: 01.12.2011
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-21 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Released: 01.12.2011
English Hardcopy
In stock
69.00 EUR
CSN EN 62047-7
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
Released: 01.02.2012
English Hardcopy
In stock
69.00 EUR
CSN EN 61747-6-2
Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
Released: 01.03.2012
English Hardcopy
In stock
98.00 EUR
CSN EN 62047-12
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Released: 01.04.2012
English Hardcopy
In stock
84.00 EUR
CSN EN 61967-8
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Released: 01.05.2012
English Hardcopy
In stock
84.00 EUR
CSN EN 61988-2-1 ed. 2
Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical
Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical
Released: 01.08.2012
English Hardcopy
In stock
84.00 EUR
CSN IEC 62047-28
Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
Released: 01.10.2017
English Hardcopy
In stock
61.00 EUR
CSN IEC 62830-2
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
Released: 01.10.2017
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-9 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Released: 01.10.2017
English Hardcopy
In stock
52.00 EUR
CSN IEC 62880-1
Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
Released: 01.06.2018
English Hardcopy
In stock
69.00 EUR
CSN EN 62047-19
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
Released: 01.04.2014
English Hardcopy
In stock
84.00 EUR