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CSN EN 61967-8
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Released: 01.05.2012
English Hardcopy
In stock
84.00 EUR
CSN EN 61988-2-1 ed. 2
Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical
Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical
Released: 01.08.2012
English Hardcopy
In stock
84.00 EUR
CSN EN IEC 62435-8
Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices
Released: 01.03.2021
English Hardcopy
In stock
61.00 EUR
CSN IEC 62047-28
Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
Released: 01.10.2017
English Hardcopy
In stock
61.00 EUR
CSN IEC 62830-2
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
Released: 01.10.2017
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-9 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Released: 01.10.2017
English Hardcopy
In stock
52.00 EUR
CSN IEC 62880-1
Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
Released: 01.06.2018
English Hardcopy
In stock
69.00 EUR
CSN EN 62047-19
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
Released: 01.04.2014
English Hardcopy
In stock
84.00 EUR
English Hardcopy
In stock
69.00 EUR
CSN EN 62047-22
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
Released: 01.04.2015
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-42
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Released: 01.04.2015
English Hardcopy
In stock
52.00 EUR
CSN EN 62047-17
Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
Released: 01.09.2015
English Hardcopy
In stock
69.00 EUR