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CSN EN 62779-2
Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
Released: 01.10.2016
English Hardcopy
In stock
61.00 EUR
CSN EN 62779-3
Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
Released: 01.12.2016
English Hardcopy
In stock
61.00 EUR
CSN EN 62433-4
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
Released: 01.01.2017
English Hardcopy
In stock
130.00 EUR
English Hardcopy
In stock
61.00 EUR
CSN EN 61747-10-1
Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods - Mechanical
Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods - Mechanical
Released: 01.03.2014
English Hardcopy
In stock
61.00 EUR
CSN EN 60191-4 ed. 2
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
Released: 01.06.2014
English Hardcopy
In stock
69.00 EUR
English Hardcopy
In stock
52.00 EUR
CSN EN 60749-8
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Released: 01.12.2003
English Hardcopy
In stock
84.00 EUR
CSN EN 60749-22
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
Released: 01.12.2003
English Hardcopy
In stock
84.00 EUR
CSN EN 61967-2
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Released: 01.04.2006
English Hardcopy
In stock
92.00 EUR
CSN EN 62047-2
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
Released: 01.05.2007
English Hardcopy
In stock
69.00 EUR
CSN EN 62258-6
Semiconductor die products - Part 6: Requirements for information concerning thermal simulation
Semiconductor die products - Part 6: Requirements for information concerning thermal simulation
Released: 01.06.2007
English Hardcopy
In stock
52.00 EUR