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CSN EN 62258-2 ed. 2
Semiconductor die products - Part 2: Exchange data formats
Semiconductor die products - Part 2: Exchange data formats
Released: 01.01.2012
English Hardcopy
In stock
106.00 EUR
CSN EN 62047-10
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
Released: 01.03.2012
English Hardcopy
In stock
61.00 EUR
CSN EN 62047-14
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials
Released: 01.10.2012
English Hardcopy
In stock
61.00 EUR
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 62435-6
Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or finished devices
Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or finished devices
Released: 01.03.2019
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 61967-1 ed. 2
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Released: 01.07.2019
English Hardcopy
In stock
84.00 EUR
CSN EN IEC 60747-16-6
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
Released: 01.02.2020
English Hardcopy
In stock
69.00 EUR
CSN EN 62047-26
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Released: 01.08.2016
English Hardcopy
In stock
84.00 EUR
CSN EN 60749-44
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Released: 01.02.2017
English Hardcopy
In stock
69.00 EUR
CSN EN 62228-2
Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
Released: 01.07.2017
English Hardcopy
In stock
92.00 EUR
CSN EN IEC 60747-17
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Released: 01.04.2021
English Hardcopy
In stock
98.00 EUR
CSN EN 60749-27
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Released: 01.03.2007
English Hardcopy
In stock
69.00 EUR