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CSN EN 62435-1
Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
Released: 01.09.2017
English Hardcopy
In stock
84.00 EUR
CSN EN 60749-4 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Released: 01.10.2017
English Hardcopy
In stock
52.00 EUR
CSN IEC 62830-1
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
Released: 01.11.2017
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 62228-5
Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
Released: 01.12.2021
English Hardcopy
In stock
130.00 EUR
CSN EN IEC 62435-9
Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special cases
Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special cases
Released: 01.04.2022
English Hardcopy
In stock
61.00 EUR
CSN EN 62047-26
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Released: 01.08.2016
English Hardcopy
In stock
84.00 EUR
CSN EN IEC 60749-37 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Released: 01.06.2023
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 60747-16-7
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
Released: 01.07.2023
English Hardcopy
In stock
92.00 EUR
CSN EN 60749-38
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Released: 01.10.2008
English Hardcopy
In stock
52.00 EUR
CSN EN 61988-2-3
Plasma display panels - Part 2-3: Measuring methods - Image quality: Defects and degradation
Plasma display panels - Part 2-3: Measuring methods - Image quality: Defects and degradation
Released: 01.04.2010
English Hardcopy
In stock
69.00 EUR
English Hardcopy
In stock
92.00 EUR
CSN EN 62341-5
Organic Light Emitting Diode (OLED) displays - Part 5: Environmental testing methods
Organic Light Emitting Diode (OLED) displays - Part 5: Environmental testing methods
Released: 01.08.2010
English Hardcopy
In stock
61.00 EUR