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CSN EN IEC 62228-5
Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
Released: 01.12.2021
English Hardcopy
In stock
130.00 EUR
CSN EN 62047-26
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Released: 01.08.2016
English Hardcopy
In stock
84.00 EUR
CSN EN 60749-44
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Released: 01.02.2017
English Hardcopy
In stock
69.00 EUR
CSN EN 62228-2
Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
Released: 01.07.2017
English Hardcopy
In stock
92.00 EUR
CSN EN IEC 60749-37 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Released: 01.06.2023
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 60747-16-7
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
Released: 01.07.2023
English Hardcopy
In stock
92.00 EUR
CSN EN 60749-16
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Released: 01.11.2003
English Hardcopy
In stock
52.00 EUR
CSN EN 61967-5
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
Released: 01.12.2003
English Hardcopy
In stock
92.00 EUR
CSN EN 60749-32
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (exterrnally induced)
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (exterrnally induced)
Released: 01.12.2003
English Hardcopy
In stock
52.00 EUR
CSN EN 60749-36
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Released: 01.12.2003
English Hardcopy
In stock
52.00 EUR
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-14
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
Released: 01.06.2004
English Hardcopy
In stock
69.00 EUR