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CSN EN 60749-34 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Released: 01.09.2011
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-29 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Released: 01.12.2011
English Hardcopy
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69.00 EUR
CSN EN 62047-9
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
Released: 01.03.2012
English Hardcopy
In stock
69.00 EUR
CSN EN 60749-40
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
Released: 01.03.2012
English Hardcopy
In stock
69.00 EUR
CSN EN 61988-2-4
Plasma display panels - Part 2-4: Measuring methods - Visual quality - Image artifacts
Plasma display panels - Part 2-4: Measuring methods - Visual quality - Image artifacts
Released: 01.05.2012
English Hardcopy
In stock
84.00 EUR
CSN EN 61988-3-2
Plasma display panels - Part 3-2: Interface - Electrical interface
Plasma display panels - Part 3-2: Interface - Electrical interface
Released: 01.04.2010
English Hardcopy
In stock
69.00 EUR
CSN EN 60749-1
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Released: 01.12.2003
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-19
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Released: 01.12.2003
English Hardcopy
In stock
52.00 EUR
English Hardcopy
In stock
52.00 EUR
CSN EN IEC 62228-1
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
Released: 01.08.2018
English Hardcopy
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52.00 EUR
CSN EN IEC 62228-3
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
Released: 01.11.2019
English Hardcopy
In stock
106.00 EUR
CSN EN IEC 60749-17 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Released: 01.11.2019
English Hardcopy
In stock
52.00 EUR