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CSN EN 62047-18
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
Released: 01.04.2014
English Hardcopy
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61.00 EUR
CSN EN 62215-3
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Released: 01.04.2014
English Hardcopy
In stock
84.00 EUR
CSN EN 60749-1
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Released: 01.12.2003
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-19
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Released: 01.12.2003
English Hardcopy
In stock
52.00 EUR
English Hardcopy
In stock
52.00 EUR
CSN EN 61747-4-1
Liquid crystal display devices - Part 4-1: Matrix colour LCD modules - Essential ratings and characteristics
Liquid crystal display devices - Part 4-1: Matrix colour LCD modules - Essential ratings and characteristics
Released: 01.06.2005
English Hardcopy
In stock
61.00 EUR
English Hardcopy
In stock
69.00 EUR
CSN EN IEC 62228-3
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
Released: 01.11.2019
English Hardcopy
In stock
106.00 EUR
CSN EN IEC 60749-17 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Released: 01.11.2019
English Hardcopy
In stock
52.00 EUR
English Hardcopy
In stock
84.00 EUR
CSN EN 60749-34 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Released: 01.09.2011
English Hardcopy
In stock
61.00 EUR
CSN EN 60749-29 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Released: 01.12.2011
English Hardcopy
In stock
69.00 EUR