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CSN EN IEC 62228-3
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
Released: 01.11.2019
English Hardcopy
In stock
106.00 EUR
CSN EN IEC 60749-17 ed. 2
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Released: 01.11.2019
English Hardcopy
In stock
52.00 EUR
CSN EN IEC 62435-3
Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data
Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data
Released: 01.09.2020
English Hardcopy
In stock
61.00 EUR
CSN EN IEC 62228-1
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
Released: 01.08.2018
English Hardcopy
In stock
52.00 EUR
English Hardcopy
In stock
61.00 EUR
CSN EN 60747-16-5
Semiconductor devices - Part 16- 5: Microwave integrated circuits - Oscillators
Semiconductor devices - Part 16- 5: Microwave integrated circuits - Oscillators
Released: 01.03.2014
English Hardcopy
In stock
92.00 EUR
CSN EN 62047-21
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
Released: 01.04.2015
English Hardcopy
In stock
61.00 EUR
CSN EN 62047-20
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
Released: 01.04.2015
English Hardcopy
In stock
98.00 EUR
CSN EN 62047-26
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
Released: 01.08.2016
English Hardcopy
In stock
84.00 EUR
CSN EN 60749-38
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Released: 01.10.2008
English Hardcopy
In stock
52.00 EUR
CSN EN 61988-2-3
Plasma display panels - Part 2-3: Measuring methods - Image quality: Defects and degradation
Plasma display panels - Part 2-3: Measuring methods - Image quality: Defects and degradation
Released: 01.04.2010
English Hardcopy
In stock
69.00 EUR
English Hardcopy
In stock
92.00 EUR